Submicron bismuth (Bi) wires
E. Konstantinov, E. Demidov Scientific Center ""Nonequilibrium Phenomena in Condensed Matter and Nanostructures",
Herzen State Pedagogical University
, St. Petersburg, Russia
Equipment: SEM Zeiss EVO 40
Thin film structures of pure bismuth on Sio2 sublayer were patterned by
electron beam lithography using negative photoresist ma-N 2403.
Series of samples of different thickness with width of the central wire of 0.5-15 microns were created.
The structures used to measure the galvanomagnetic properties (resistance,
magnetoresistance and Hall coefficient) of thin bismuth films.
The study was performeded in temperature range of 77-300 K in applied magnetic fields up to 3.5 T.
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