Do you have a procedure on how to hook your system into new SEM? Do you have a procedure on how to hook your system into new SEM like JEOL, Zaiss, FEI, Hitachi, etc.?
Usually situation is rather auspicious. In most cases we use the standard SEM External Scan Interface which in embedded in all brand-name microscopes. Initially this interface is intended for connection of different X-Ray analysis systems. Of course, all vendors made its own interfaces, and usually we need to collect some information about interface before installation. We need to know type of sockets, schemes, altitudes of signals, distances and so on.